X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 7.5 291 0.2 M Ammonium sulfate, 0.1 M Hepes, 25% w/v PEG3350
Unit Cell:
a: 78.392 Å b: 78.392 Å c: 78.392 Å α: 90.000° β: 90.000° γ: 90.000°
Symmetry:
Space Group: I 21 3
Crystal Properties:
Matthew's Coefficient: 3.45 Solvent Content: 64.35
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT FREE R-VALUE 1.77 39.1960 7995 810 99.6900 0.1620 0.2059 29.5848
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.770 50.000 99.800 0.150 ? 9.400 27 ? 8003 ? ? 21.810
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.770 1.800 95.800 ? ? 3.3 9.0 385
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
ROTATING ANODE RIGAKU MICROMAX-007 HF 1.5418 ? ?
Software
Software Name Purpose Version
HKL-2000 data reduction .
SCALEPACK data scaling .
PHASER phasing .
PHENIX refinement .
PDB_EXTRACT data extraction 3.15
Coot model building .