ISDA

X-RAY DIFFRACTION

Crystallization Details

Method	pH	Temprature	Details
X-RAY DIFFRACTION	8.0	293	Apc4 crystals were grown by vapour-diffusion in a buffer containing 10 mM malic acid, 20 mM MES, 20 mM Tris.HCl (pH 8.0), 160 mM NDSB 196, 10 mM EDTA and 19% (v/v) PEG 1500. Crystals were incubated in a cryoprotection buffer comprising 10 mM malic acid, 20 mM MES, 20 mM Tris.HCl (pH 8.0), 160 mM NDSB 196, 10 mM EDTA, 22% (v/v) PEG 1500 and 20% (v/v) ethylene glycol prior to freezing in liquid nitrogen.

Unit Cell:

a: 139.181 Å b: 139.181 Å c: 156.106 Å α: 90.000° β: 90.000° γ: 90.000°

Symmetry:

Space Group: P 4 21 2

Crystal Properties:

Matthew's Coefficient: 4.36 Solvent Content: 71.76

Refinement Statistics

Diffraction ID	Structure Solution Method	Cross Validation Method	Resolution Limit (High)	Resolution Limit (Low)	Number of Reflections (Observed)	Number of Reflections (R-free)	Percent Reflections (Observed)	R-Work	R-Free	Mean Isotropic
X-RAY DIFFRACTION	?	FREE R-VALUE	3.4000	51.9430	21631	700	99.5600	0.2208	0.2749	91.8312

Data Collection

Overall

Resolution Limit (High)	Resolution Limit (Low)	Percent Possible (Observed)	R Merge I (Observed)	R Sym I (Observed)	Net I Over Average Sigma (I)	Redundancy	Number Reflections (All)	Number Reflections (Observed)	Observed Criterion Sigma (F)	Observed Criterion Sigma (I)	B (Isotropic) From Wilson Plot
3.4	57.8	99.8	0.182	?	5.16	6.5	21671	21671	0	0	?

Highest Resolution Shell

#	Resolution Limits (Low)	Resolution Limits (High)	Percent Possible (All)	Percent Possible (Observed)	R-Sym I (Observed)	Mean I Over Sigma (Observed)	Redundancy	Number Unique Reflections (All)
1	3.40	3.67	99.6	?	?	2.3	6.5	4371

Diffraction

Diffraction experiment

Crystal ID	Scattering Type	Data Collection Temprature	Detector	Detector Type	Details	Collection Date	Monochromator	Protocol
1		100 K			?

Radiation Source

Source	Type	Wavelength List	Synchrotron Site	Beamline
SYNCHROTRON	DIAMOND BEAMLINE I24	0.987	Diamond	I24

Software