X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 6.0 293 100mM MES, 5%(w/w) PEG1000, 20%(v/v) PEG200
Unit Cell:
a: 50.282 Å b: 55.252 Å c: 58.763 Å α: 107.04° β: 102.49° γ: 91.80°
Symmetry:
Space Group: P 1
Crystal Properties:
Matthew's Coefficient: 2.32 Solvent Content: 47.09
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT FREE R-VALUE 1.700 35.250 61384 3105 95.03 0.1675 0.1896 ?
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.7 50 95.9 ? ? 14.64 3.3 ? 61647 ? ? ?
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.70 1.73 94.4 ? ? 3.63 3.3 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON PAL/PLS BEAMLINE 5C (4A) 0.97940 PAL/PLS 5C (4A)
Software
Software Name Purpose Version
PHENIX refinement 1.9_1692
HKL-2000 data processing .
MOLREP phasing .
Coot model building .