ELECTRON MICROSCOPY

Sample

PARM ANTIPARALLEL DOUBLET

Specimen Preperation
Sample Aggregation State FILAMENT
Vitrification Instrument ?
Cryogen Name ?
Sample Vitrification Details VIROBOT MARK IV (FEI)
3D Reconstruction
Reconstruction Method HELICAL
Number of Particles ?
Reported Resolution (Å) 11
Resolution Method OTHER
Other Details THIS IS A MODEL OF THE PARM ANTIPARALLEL ANTIPARALLEL DOUBLET BASED ON CRYOEM DATA. TWO COPIES OF THE PARM AMPPNP CRYO-EM FILAMENT STRUCTURE WERE PLACED IN AN ANTIPARALLEL ORIENTATION. ANTIPARALLEL ASSIGNMENT WAS DONE USING CRYO-EM ALIGNMENT. THIS IS A MODEL OF THE PARM ANTIPARALLEL DOUBLET CONSTRUCTED USING CRYO-EM DATA. ONLY C-ALPHAS HAVE BEEN DEPOSITED.
Refinement Type
Symmetry Type HELICAL
Map-Model Fitting and Refinement
ID
Refinement Space
Refinement Protocol
Refinement Target
Overall B Value
Fitting Procedure
Details
Data Acquisition
Detector Type FEI FALCON II (4k x 4k)
Electron Dose (electrons/Å2) 0.3
Imaging Experiment
Date of Experiment ?
Temprature (Kelvin)
Microscope Model FEI TITAN KRIOS
Minimum Defocus (nm) 3000
Maximum Defocus (nm) 6000
Minimum Tilt Angle (degrees) ?
Maximum Tilt Angle (degrees) ?
Nominal CS 2.7
Imaging Mode BRIGHT FIELD
Specimen Holder Model .
Nominal Magnification ?
Calibrated Magnification ?
Source FIELD EMISSION GUN
Acceleration Voltage (kV) 300
Imaging Details ?
Image Processing
CTF Correction Type CTF Correction Details Number of Particles Selected Particle Selection Details