X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 7.5 293 0.007 M cadmium sulfate, 0.1 M Hepes, and 1.5 M sodium acetate
Unit Cell:
a: 8.519 Å b: 9.540 Å c: 25.405 Å α: 99.940° β: 99.560° γ: 90.100°
Symmetry:
Space Group: P 1
Crystal Properties:
Matthew's Coefficient: 1.51 Solvent Content: 18.30
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION AB INITIO PHASING FREE R-VALUE 1.0010 9.3920 3131 148 74.6700 0.1102 0.1482 6.4081
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.000 50.000 74.900 0.050 ? 30.300 2.500 ? 3145 ? ? 3.450
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.000 1.040 53.200 ? ? ? 1.700 224
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 23-ID-B 0.77490 APS 23-ID-B
Software
Software Name Purpose Version
HKL-2000 data reduction .
PDB_EXTRACT data extraction 3.15
HKL-2000 data scaling .
SHELX phasing .
PHENIX refinement (phenix.refine: 1.9_1692)
DENZO data reduction .
SCALEPACK data scaling .