X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 4.0 291 0.1M SPG buffer, 0.01M Tris-HCl, 31% PEG1500, 50mM NaCl, 1mM DTT, pH 4.0, VAPOR DIFFUSION, SITTING DROP, temperature 291K
Unit Cell:
a: 43.349 Å b: 63.447 Å c: 65.702 Å α: 90.00° β: 90.00° γ: 90.00°
Symmetry:
Space Group: P 21 21 21
Crystal Properties:
Matthew's Coefficient: 1.96 Solvent Content: 37.33
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT ? 1.853 20.702 15789 788 98.82 0.1687 0.2076 14.7150
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.850 21.150 98.900 0.133 ? 12.100 6.300 16016 15827 ? ? ?
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.853 1.969 94.0 ? ? ? ? ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
ROTATING ANODE OTHER 1.541 ? ?
Software
Software Name Purpose Version
Aimless data scaling 0.1.29
PHASER phasing 2.5.3
PHENIX refinement 1.8.2_1309
PDB_EXTRACT data extraction 3.11
CrysalisPro data collection PRO
XSCALE data scaling .
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