X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 5.0 291 Crystallization buffer was 0.02 M Calcium chloride, 0.1 M Na-succinate (pH 5.0), 30% (v/v) (+/-)-2-Methyl-2,4-pentanediol
Unit Cell:
a: 89.562 Å b: 136.336 Å c: 73.482 Å α: 90.000° β: 90.000° γ: 90.000°
Symmetry:
Space Group: C 2 2 21
Crystal Properties:
Matthew's Coefficient: 3.09 Solvent Content: 60.25
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION SIRAS FREE R-VALUE 1.8000 28.4040 41703 8024 99.3400 0.1559 0.1879 30.4588
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.800 29.163 99.400 ? 0.067 24.300 14.400 41718 41718 ? ? 25.210
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.800 1.900 95.900 ? 0.541 1.400 12.100 5782
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON EMBL/DESY, HAMBURG BEAMLINE X12 0.9887, 0.97622 EMBL/DESY, HAMBURG X12
Software
Software Name Purpose Version
MAR345dtb data collection .
MOSFLM data reduction 7.0.6
SCALA data scaling 3.3.16
SHELX phasing .
Coot model building .
PHENIX refinement 1.8.3
PDB_EXTRACT data extraction 3.15