X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 7.0 289 2% Tacsimate, pH 7.0, 6% PEG3350
Unit Cell:
a: 48.896 Å b: 76.418 Å c: 98.345 Å α: 89.830° β: 89.640° γ: 73.210°
Symmetry:
Space Group: P 1
Crystal Properties:
Matthew's Coefficient: 2.08 Solvent Content: 40.82
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT FREE R-VALUE 2.8 49.1720 31508 1636 92.4300 0.1890 0.2206 45.1453
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.800 50.000 98.500 0.054 ? 10.700 2.400 ? 33408 ? ? ?
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.800 2.850 97.600 ? ? ? 2.200 1680
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 19-ID 0.97929 APS 19-ID
Software
Software Name Purpose Version
HKL-3000 data collection .
HKL-3000 data scaling .
PHASER phasing .
PHENIX refinement .
PDB_EXTRACT data extraction 3.15
Coot model building .
HKL-3000 data reduction .
Feedback Form
Name
Email
Institute
Feedback