X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 4.6 294.15 30% PEG 4000, 0.1M CH3COONa.3H2O pH4.6, 0.1M CH3COONH4
Unit Cell:
a: 36.596 Å b: 54.335 Å c: 68.588 Å α: 108.13° β: 97.03° γ: 104.09°
Symmetry:
Space Group: P 1
Crystal Properties:
Matthew's Coefficient: 1.96 Solvent Content: 37.40
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION ? THROUGHOUT 1.49 30.01 70382 3749 95.45 0.20076 0.24558 21.618
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.49 50.00 98.9 0.030 ? 47.91 3.0 ? 77520 ? ? ?
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.49 1.51 89.9 ? ? ? ? ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 200 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 21-ID-D 1.0781 APS 21-ID-D
Software
Software Name Purpose Version
REFMAC refinement 5.5.0109
DENZO data reduction .
HKL-2000 data scaling .
REFMAC phasing .