X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 6.7 298 20% PEG8000, 0.2M NaCl, Bis-Tris Propane pH7.0
Unit Cell:
a: 45.431 Å b: 51.991 Å c: 120.536 Å α: 90.000° β: 95.490° γ: 90.000°
Symmetry:
Space Group: P 1 21 1
Crystal Properties:
Matthew's Coefficient: 2.20 Solvent Content: 44.10
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT FREE R-VALUE 1.9820 21.7880 38914 1956 99.3700 0.1771 0.2212 15.8500
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.980 50.000 99.400 0.115 ? 9.300 3.000 ? 38935 ? ? 15.520
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.980 2.010 96.900 ? ? ? 2.100 1860
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 108 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 19-BM 0.979 APS 19-BM
Software
Software Name Purpose Version
HKL-3000 data collection .
SCALEPACK data scaling .
PHASER phasing 2.5.1
PHENIX refinement .
PDB_EXTRACT data extraction 3.15
HKL-3000 data reduction .