X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION ? 298 25% (v/v) 1,2-propanediol 5% (w/v) PEG-3000 10% (v/v) glycerol 0.1 M Natrium phosphate-citrate, pH 4.2
Unit Cell:
a: 117.480 Å b: 117.480 Å c: 56.525 Å α: 90.00° β: 90.00° γ: 90.00°
Symmetry:
Space Group: P 4
Crystal Properties:
Matthew's Coefficient: 2.19 Solvent Content: 43.83
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT FREE R-VALUE 1.250 56.525 212410 10645 99.92 0.1252 0.1482 ?
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.25 56.53 99.9 0.055 ? 21.88 12.93 ? 212581 ? ? ?
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.25 1.28 98.9 ? ? 1.54 9.95 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON SLS BEAMLINE X06DA 1.00004 SLS X06DA
Software
Software Name Purpose Version
PHENIX refinement (phenix.refine: dev_1839)
XDS data reduction .
XSCALE data scaling .
PHASER phasing .