X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 4.6 291 1.5M ammonium sulfate
Unit Cell:
a: 40.870 Å b: 72.980 Å c: 79.020 Å α: 117.520° β: 104.990° γ: 90.000°
Symmetry:
Space Group: P 1
Crystal Properties:
Matthew's Coefficient: 3.91 Solvent Content: 68.58
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT FREE R-VALUE 1.4000 23.9340 127114 1961 83.3200 0.1864 0.2058 18.9842
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.400 67.032 84.900 ? 0.058 7.700 2.900 129508 129508 ? ? 10.450
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.400 1.480 81.100 ? 0.267 1.100 2.900 18056
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON SLS BEAMLINE X06DA 1.00003 SLS X06DA
Software
Software Name Purpose Version
SCALA data scaling 3.3.21
PHENIX refinement .
PDB_EXTRACT data extraction 3.15
MOSFLM data reduction .
PHASER phasing .