ISDA: 4YVX

X-RAY DIFFRACTION

Crystallization Details

Method	pH	Temprature	Details
X-RAY DIFFRACTION	6.0	289	15-20% (w/v) PEG 8000, 100 mM MES, 0.14M NaCl

Unit Cell:

a: 47.000 Å b: 49.265 Å c: 83.723 Å α: 74.65° β: 86.04° γ: 69.41°

Symmetry:

Space Group: P 1

Crystal Properties:

Matthew's Coefficient: 2.44 Solvent Content: 49.52

Refinement Statistics

Diffraction ID	Structure Solution Method	Cross Validation Method	Resolution Limit (High)	Resolution Limit (Low)	Number of Reflections (Observed)	Number of Reflections (R-free)	Percent Reflections (Observed)	R-Work	R-Free	Mean Isotropic
X-RAY DIFFRACTION	MOLECULAR REPLACEMENT	THROUGHOUT	2.30	80.709	28584	1514	99.93	0.18671	0.23234	26.613

Data Collection

Overall

Resolution Limit (High)	Resolution Limit (Low)	Percent Possible (Observed)	R Merge I (Observed)	R Sym I (Observed)	Net I Over Average Sigma (I)	Redundancy	Number Reflections (All)	Number Reflections (Observed)	Observed Criterion Sigma (F)	Observed Criterion Sigma (I)	B (Isotropic) From Wilson Plot
2.300	80.709	99.900	?	0.155	9.200	5.700	30098	30098	?	?	?

Highest Resolution Shell

#	Resolution Limits (Low)	Resolution Limits (High)	Percent Possible (All)	Percent Possible (Observed)	R-Sym I (Observed)	Mean I Over Sigma (Observed)	Redundancy	Number Unique Reflections (All)
1	2.300	2.420	100.000	?	0.615	1.100	5.600	4378

Diffraction

Diffraction experiment

Crystal ID	Scattering Type	Data Collection Temprature	Detector	Detector Type	Details	Collection Date	Monochromator	Protocol
1		100 K			?

Radiation Source

Source	Type	Wavelength List	Synchrotron Site	Beamline
SEALED TUBE	OXFORD DIFFRACTION ENHANCE ULTRA	1.5418	?	?

Software