X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 6 298 10mg/ml protein in 10mM Tris-HCl pH 8, 38 mM NaCl mixed in v/v ratio 1:1 with ammonium sulphate 2.2M, sodium thiocyanate 0.2 M
Unit Cell:
a: 39.060 Å b: 60.950 Å c: 48.900 Å α: 90.000° β: 104.330° γ: 90.000°
Symmetry:
Space Group: P 1 21 1
Crystal Properties:
Matthew's Coefficient: 2.00 Solvent Content: 38.57
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION SAD FREE R-VALUE 2.0000 47.3790 29468 1441 99.7200 0.2568 0.2962 49.7377
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.000 50 99.700 0.091 ? 11.980 7.4 ? 29510 ? -3.000 36.230
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.000 2.100 99.200 ? ? 2.250 7 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON SOLEIL BEAMLINE PROXIMA 1 0.97895 SOLEIL PROXIMA 1
Software
Software Name Purpose Version
PHENIX refinement (phenix.refine: 1.9_1692)
XDS data reduction .
XSCALE data scaling .
SHELXDE phasing .