X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 7.0 291 The crystals were grown, using the sitting drop method, by adding 1 uL of 2mM d(CCGGATCCGG) and 1 uL 4 mM rac-[Ru(TAP)2(dppz)].2Cl to 6 uL of a solution containing 10% (v/v) 2-methyl-2,4-pentanediol, 12 mM spermine-tetraHCL, 20mM BaCl2, 80mM KCl and 40 mM Na-cacodylate pH 7. This was equilibrated, at 18 C, against 500 uL 2-methyl-2,4-pentanediol.
Unit Cell:
a: 47.380 Å b: 47.380 Å c: 33.830 Å α: 90.00° β: 90.00° γ: 90.00°
Symmetry:
Space Group: P 43 21 2
Crystal Properties:
Matthew's Coefficient: 3.12 Solvent Content: 60.53
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION SAD THROUGHOUT 1.88 33.83 3250 149 99.85 0.20028 0.25736 46.469
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.88 33.83 99.9 0.052 0.020 21.1 11.7 ? 3423 ? -3 ?
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.88 1.93 100 ? ? 1.8 12.3 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON DIAMOND BEAMLINE I02 0.97949 Diamond I02
Software
Software Name Purpose Version
REFMAC refinement 5.8.0073
xia2 data reduction .
Coot model building .
SHELX phasing .
xia2 data scaling .