X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 6.2 287 0.2M NACL, 10% PEG 8000
Unit Cell:
a: 60.592 Å b: 168.925 Å c: 170.272 Å α: 60.29° β: 90.07° γ: 90.05°
Symmetry:
Space Group: P 1
Crystal Properties:
Matthew's Coefficient: 6.18 Solvent Content: 80.11
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT THROUGHOUT 2.10 49.34 335766 16980 98.0 0.208 0.225 27.01
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.100 50.000 98.2 0.10300 ? 7.7000 3.900 ? 335882 ? ? ?
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.10 2.18 97.3 ? ? ? 3.90 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON SSRF BEAMLINE BL17U 0.97935 SSRF BL17U
Software
Software Name Purpose Version
HKL-2000 data reduction .
SCALEPACK data scaling .
REFMAC refinement 5.6.0117
PHASER phasing .
HKL data reduction .
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