X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 7.0 293 100 mM sodium formate, 12% (w/v) PEG 3350
Unit Cell:
a: 79.620 Å b: 80.680 Å c: 98.020 Å α: 87.25° β: 85.62° γ: 89.92°
Symmetry:
Space Group: P 1
Crystal Properties:
Matthew's Coefficient: 2.29 Solvent Content: 46.29
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT THROUGHOUT 3.58 97.62 26826 1499 98.93 0.27528 0.30927 ?
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
3.58 97.62 98.9 ? 0.108 11.6 3.5 ? 28326 ? ? ?
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 3.58 3.67 97.5 ? ? 2.7 3.5 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON DIAMOND BEAMLINE I03 0.98000 Diamond I03
Software
Software Name Purpose Version
REFMAC refinement 5.8.0073
XDS data reduction .
SCALA data scaling .
PHASER phasing .