X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 8.5 298 0.1 M Tris-HCl, 3.5 M Sodiumformiate
Unit Cell:
a: 74.279 Å b: 74.279 Å c: 174.726 Å α: 90.000° β: 90.000° γ: 120.000°
Symmetry:
Space Group: P 3 2 1
Crystal Properties:
Matthew's Coefficient: 2.16 Solvent Content: 42.96
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT THROUGHOUT 1.7500 43.170 53810 2687 93.8700 0.1404 0.1748 14.8640
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.750 43.170 93.900 0.055 ? 21.000 4.900 ? 53810 ? ? ?
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.750 1.780 78.300 ? ? 4.900 3.500 2429
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON BESSY BEAMLINE 14.1 0.91841 BESSY 14.1
Software
Software Name Purpose Version
XDS data reduction .
Aimless data scaling 0.1.29
PHASER phasing 2.5.2
ARP model building .
Coot model building .
REFMAC refinement 5.8.0069
PDB_EXTRACT data extraction 3.15
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