ISDA

4XKZ

X-RAY DIFFRACTION

Crystallization Details

Method	pH	Temprature	Details
X-RAY DIFFRACTION	7.5	289	PsaeA.18849.a.B4.PW37589 at 18 mg/mL against Morpheus screen condition B6 10% PEG 8000, 20% ethylene glycol, 0.1 M MOPS-HEPES, pH7.5, 0.03 M sodium fluoride, 0.03 M sodium bromide, 0.03 M sodium iodide, crystal tracking ID 259627b6, unique puck ID oaf3-9

Unit Cell:

a: 103.360 Å b: 103.360 Å c: 79.140 Å α: 90.000° β: 90.000° γ: 90.000°

Symmetry:

Space Group: P 4 21 2

Crystal Properties:

Matthew's Coefficient: 3.44 Solvent Content: 64.24

Refinement Statistics

Diffraction ID	Structure Solution Method	Cross Validation Method	Resolution Limit (High)	Resolution Limit (Low)	Number of Reflections (Observed)	Number of Reflections (R-free)	Percent Reflections (Observed)	R-Work	R-Free	Mean Isotropic
X-RAY DIFFRACTION	MOLECULAR REPLACEMENT	THROUGHOUT	1.9500	50.0	31655	1585	99.3000	0.1576	0.1934	35.2860

Data Collection

Overall

Resolution Limit (High)	Resolution Limit (Low)	Percent Possible (Observed)	R Merge I (Observed)	R Sym I (Observed)	Net I Over Average Sigma (I)	Redundancy	Number Reflections (All)	Number Reflections (Observed)	Observed Criterion Sigma (F)	Observed Criterion Sigma (I)	B (Isotropic) From Wilson Plot
1.950	50	99.300	0.063	?	20.800	7.5	?	31655	?	-3.000	31.840

Highest Resolution Shell

#	Resolution Limits (Low)	Resolution Limits (High)	Percent Possible (All)	Percent Possible (Observed)	R-Sym I (Observed)	Mean I Over Sigma (Observed)	Redundancy	Number Unique Reflections (All)
1	1.950	2.000	100.000	?	?	3.750	?	?

Diffraction

Diffraction experiment

Crystal ID	Scattering Type	Data Collection Temprature	Detector	Detector Type	Details	Collection Date	Monochromator	Protocol
1		100 K			?

Radiation Source

Source	Type	Wavelength List	Synchrotron Site	Beamline
SYNCHROTRON	APS BEAMLINE 21-ID-F	0.97872	APS	21-ID-F

Software