X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION ? 295 0.04 M potassium di-hydrogen phosphate, 16% PEG 8000, 20% glycerol
Unit Cell:
a: 42.020 Å b: 42.020 Å c: 191.980 Å α: 90.000° β: 90.000° γ: 90.000°
Symmetry:
Space Group: P 43 21 2
Crystal Properties:
Matthew's Coefficient: 2.13 Solvent Content: 42.25
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION SAD FREE R-VALUE 1.8800 47.990 14839 789 99.2900 0.1684 0.1884 25.8225
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.880 47.990 99.500 0.056 ? 53.500 31.700 ? 14841 ? ? 18.383
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.880 1.930 97.100 ? ? 5.000 13.300 1032
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 93 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
ROTATING ANODE RIGAKU MICROMAX-007 HF 1.541780 ? ?
Software
Software Name Purpose Version
PHENIX refinement 1.9-1692
StructureStudio data collection 2.2.1
xia2 data reduction 0.3.7.0
SHELX phasing 2013
PDB_EXTRACT data extraction 3.15
XDS data scaling .
XSCALE data scaling .