ISDA: 4XFJ

X-RAY DIFFRACTION

Crystallization Details

Method	pH	Temprature	Details
X-RAY DIFFRACTION	8.76	290	Optimization screen: 100mM Tris pH 8.67, 200mM MgCl2, 20% PEG 8000; MythA.00809.a.B1.PW37508 at 20.mg/ml with 5mM AMPPNP, 5mM Arg, 2.5mM MgCl2; cryo: 20% EG, 2.5mM AMPPNP, 5mM Arg, 0.5mM MgCl2, 5mM Asp; tray 258539d3, puck yyj4-1

Unit Cell:

a: 93.830 Å b: 143.410 Å c: 58.030 Å α: 90.000° β: 90.000° γ: 90.000°

Symmetry:

Space Group: P 21 21 2

Crystal Properties:

Matthew's Coefficient: 2.16 Solvent Content: 43.07

Refinement Statistics

Diffraction ID	Structure Solution Method	Cross Validation Method	Resolution Limit (High)	Resolution Limit (Low)	Number of Reflections (Observed)	Number of Reflections (R-free)	Percent Reflections (Observed)	R-Work	R-Free	Mean Isotropic
X-RAY DIFFRACTION	MOLECULAR REPLACEMENT	FREE R-VALUE	1.5500	36.8960	113814	4897	99.6500	0.1378	0.1820	22.4170

Data Collection

Overall

Resolution Limit (High)	Resolution Limit (Low)	Percent Possible (Observed)	R Merge I (Observed)	R Sym I (Observed)	Net I Over Average Sigma (I)	Redundancy	Number Reflections (All)	Number Reflections (Observed)	Observed Criterion Sigma (F)	Observed Criterion Sigma (I)	B (Isotropic) From Wilson Plot
1.550	50	99.700	0.045	?	23.400	4.9	?	114110	?	-3.000	14.900

Highest Resolution Shell

#	Resolution Limits (Low)	Resolution Limits (High)	Percent Possible (All)	Percent Possible (Observed)	R-Sym I (Observed)	Mean I Over Sigma (Observed)	Redundancy	Number Unique Reflections (All)
1	1.550	1.590	99.900	?	?	3.310	4.9	?

Diffraction

Diffraction experiment

Crystal ID	Scattering Type	Data Collection Temprature	Detector	Detector Type	Details	Collection Date	Monochromator	Protocol
1		100 K			?

Radiation Source

Source	Type	Wavelength List	Synchrotron Site	Beamline
SYNCHROTRON	APS BEAMLINE 21-ID-F	0.97872	APS	21-ID-F

Software