ISDA: 4XD7

X-RAY DIFFRACTION

Crystallization Details

Method	pH	Temprature	Details
X-RAY DIFFRACTION	?	298	[drop]10 % PEG 6,000, 0.20 M sodium chloride, 0.05 M Tris-sulphate buffer (pH 8.0), 2mM DTT, 5mM CyDTA, 10% (v/v) ethyleneglycol and 10 mg/ml protein/ [reservoir] 14-16 % PEG 6,000, 0.2 M sodium chloride, 0.05 M Tris-sulphate buffer (pH 8.0), 5mM CyDTA and 10% (v/v) ethyleneglycol

Unit Cell:

a: 233.395 Å b: 233.395 Å c: 303.964 Å α: 90.00° β: 90.00° γ: 90.00°

Symmetry:

Space Group: I 41 2 2

Crystal Properties:

Matthew's Coefficient: 2.79 Solvent Content: 55.93

Refinement Statistics

Diffraction ID	Structure Solution Method	Cross Validation Method	Resolution Limit (High)	Resolution Limit (Low)	Number of Reflections (Observed)	Number of Reflections (R-free)	Percent Reflections (Observed)	R-Work	R-Free	Mean Isotropic
X-RAY DIFFRACTION	?	?	3.900	19.989	34904	3597	98.96	0.2514	0.2817	?

Data Collection

Overall

Resolution Limit (High)	Resolution Limit (Low)	Percent Possible (Observed)	R Merge I (Observed)	R Sym I (Observed)	Net I Over Average Sigma (I)	Redundancy	Number Reflections (All)	Number Reflections (Observed)	Observed Criterion Sigma (F)	Observed Criterion Sigma (I)	B (Isotropic) From Wilson Plot
3.900	69.200	99.6	0.10	?	14.7000	6.600	?	38420	?	?	?

Highest Resolution Shell

#	Resolution Limits (Low)	Resolution Limits (High)	Percent Possible (All)	Percent Possible (Observed)	R-Sym I (Observed)	Mean I Over Sigma (Observed)	Redundancy	Number Unique Reflections (All)
1	3.9	4.11	97.9	?	?	3.3	5.7	?

Diffraction

Diffraction experiment

Crystal ID	Scattering Type	Data Collection Temprature	Detector	Detector Type	Details	Collection Date	Monochromator	Protocol
1		100 K			?

Radiation Source

Source	Type	Wavelength List	Synchrotron Site	Beamline
SYNCHROTRON	PHOTON FACTORY BEAMLINE BL-6A	0.97879	Photon Factory	BL-6A

Software