X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 4.2 293 38 % PEG 300, 100 mM phosphate citrate pH 4.2
Unit Cell:
a: 121.123 Å b: 121.123 Å c: 121.123 Å α: 90.00° β: 90.00° γ: 90.00°
Symmetry:
Space Group: P 4 3 2
Crystal Properties:
Matthew's Coefficient: 4.48 Solvent Content: 72.53
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION SAD THROUGHOUT 2.14 29.38 17346 877 99.91 0.2039 0.2223 32.54
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.14 29.38 99.91 0.142 ? 25.5 28.9 17353 17353 ? ? 30.11
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.14 2.27 97 ? ? 4.2 14.5 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON DIAMOND BEAMLINE I04 0.9793 Diamond I04
Software
Software Name Purpose Version
BUSTER refinement 2.10.1
XDS data reduction .
SCALA data scaling .
SHELX phasing .