X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 6.5 293 0.1 MES pH 6.5, 10-14 % w/v PEG 20000
Unit Cell:
a: 43.470 Å b: 92.140 Å c: 96.110 Å α: 65.890° β: 83.660° γ: 84.120°
Symmetry:
Space Group: P 1
Crystal Properties:
Matthew's Coefficient: 3.03 Solvent Content: 59.44
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT THROUGHOUT 2.1500 87.4800 71885 3707 97.8700 0.1803 0.1997 58.0900
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.150 87.480 97.900 0.078 ? 9.100 3.900 ? 71890 ? ? 42.520
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.150 2.200 96.700 ? ? 1.600 2.800 4584
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON CLSI BEAMLINE 08B1-1 1.033 CLSI 08B1-1
Software
Software Name Purpose Version
xia2 data scaling .
Aimless data scaling 0.3.6
PHASER phasing .
BUSTER refinement .
PDB_EXTRACT data extraction 3.15
XSCALE data scaling .
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