X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 6.5 293 0.1 MES pH 6.5, 10-14 % w/v PEG 20000
Unit Cell:
a: 44.072 Å b: 90.944 Å c: 94.441 Å α: 109.270° β: 99.030° γ: 101.530°
Symmetry:
Space Group: P 1
Crystal Properties:
Matthew's Coefficient: 2.96 Solvent Content: 58.40
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT THROUGHOUT 2.4000 46.0400 49081 2518 95.3300 0.2348 0.2743 90.2000
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.400 46.040 95.300 0.031 ? 16.300 2.000 ? 49087 ? ? 63.080
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.400 2.480 96.500 ? ? 2.000 2.000 4598
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON CLSI BEAMLINE 08B1-1 0.978 CLSI 08B1-1
Software
Software Name Purpose Version
xia2 data scaling .
Aimless data scaling 0.3.6
PHASER phasing .
BUSTER refinement .
REFMAC refinement .
PDB_EXTRACT data extraction 3.15
XSCALE data scaling .