X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 8.0 293 8-10% w/v PEG 3350, 200 mM NaCl, 200 mM sodium acetate (pH 8.0), 100 mM HEPES (pH 7.0) and 20 % ethylene glycol
Unit Cell:
a: 162.289 Å b: 162.289 Å c: 228.024 Å α: 90.000° β: 90.000° γ: 120.000°
Symmetry:
Space Group: P 63
Crystal Properties:
Matthew's Coefficient: 3.78 Solvent Content: 67.44
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION SAD THROUGHOUT 3.1900 66.1100 55989 2869 99.9800 0.1666 0.1907 120.7800
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
3.19 66.11 99.97 ? 0.064 7.4 6.7 ? 55989 ? ? ?
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 3.19 3.26 100 ? ? 1.9 6.7 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON CLSI BEAMLINE 08B1-1 0.978 CLSI 08B1-1
Software
Software Name Purpose Version
SHARP phasing .
BUSTER-TNT refinement .
REFMAC refinement .
PDB_EXTRACT data extraction 3.15
XDS data reduction .
SCALEPACK data scaling .