X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 7.0 277 0.1 M Sodium Acetate (pH 4.2), 0.7 M NaH2PO4, 1.05 M K2HPO4, 2 mM DTT
Unit Cell:
a: 57.260 Å b: 57.260 Å c: 76.290 Å α: 90.000° β: 90.000° γ: 90.000°
Symmetry:
Space Group: P 41 21 2
Crystal Properties:
Matthew's Coefficient: 2.95 Solvent Content: 58.31
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION SIRAS FREE R-VALUE 1.5000 45.7960 19903 992 94.9300 0.1957 0.2181 28.9816
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.500 45.8 95.300 0.061 ? 33.880 24.3 ? 19975 ? -3.000 19.970
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.500 1.540 99.800 ? ? 3.300 ? ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON SLS BEAMLINE X06DA 0.97929 SLS X06DA
Software
Software Name Purpose Version
XDS data reduction .
XSCALE data scaling .
PHENIX refinement 1839
PDB_EXTRACT data extraction 3.15
SHELXDE phasing .