X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 8.5 290 MCSG1 screen, g11 40% PEG 300, 100mM NaPhosphate pH 4.2; BrovA.00085.c.B1.PS02133 at 15mg/ml, supplemented with 2.5mM NAD; direct cryo; tray 257996g11, puck kpy8-8
Unit Cell:
a: 76.480 Å b: 86.460 Å c: 126.850 Å α: 90.000° β: 90.000° γ: 90.000°
Symmetry:
Space Group: I 2 2 2
Crystal Properties:
Matthew's Coefficient: 2.89 Solvent Content: 57.46
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT FREE R-VALUE 1.8500 43.2300 36179 1810 99.7500 0.1686 0.1993 35.5764
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.850 50 99.700 0.035 0.035 26.390 4.7 36273 36182 ? -3.000 25.870
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.850 1.900 99.100 ? ? 2.010 2.8 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
ROTATING ANODE RIGAKU 1.5418 ? ?
Software
Software Name Purpose Version
XDS data reduction .
XSCALE data scaling 2.5.6
PHASER phasing .
ARP model building .
Coot model building .
PHENIX refinement .
PDB_EXTRACT data extraction 3.15
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