X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 6.5 289 0.1M Bis-TRIS HCl pH 6.5, 2M ammonium sulfate
Unit Cell:
a: 82.271 Å b: 100.482 Å c: 160.103 Å α: 90.000° β: 90.000° γ: 90.000°
Symmetry:
Space Group: P 21 21 21
Crystal Properties:
Matthew's Coefficient: 2.68 Solvent Content: 54.03
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MAD THROUGHOUT 2.0000 37.8000 85849 4428 99.6100 0.1605 0.1891 26.9360
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.000 50.000 99.700 0.113 ? 6.500 6.400 90011 90011 ? -3 22
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.000 2.030 98.800 ? ? ? 6.300 4403
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 19-ID 0.97915, 0.97929 APS 19-ID
Software
Software Name Purpose Version
HKL-3000 phasing .
HKL-3000 data scaling .
DM phasing 6.3
SHELX phasing .
MLPHARE phasing .
Coot model building .
ARP model building .
WARP model building .
SOLVE phasing .
RESOLVE model building .
PDB_EXTRACT data extraction 3.15
REFMAC refinement 5.8.0073
DENZO data reduction .
SCALEPACK data scaling .
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