4WHV

X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 8.0 298 1.04 M (NH4)2HPO4
Unit Cell:
a: 341.379 Å b: 341.379 Å c: 113.447 Å α: 90.000° β: 90.000° γ: 120.000°
Symmetry:
Space Group: P 64 2 2
Crystal Properties:
Matthew's Coefficient: 5.31 Solvent Content: 76.84
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT FREE R-VALUE 8.3 49.2740 4072 189 99.4100 0.3298 0.3374 522.6599
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
8.300 50.000 100.000 0.191 ? 6.700 21.800 ? 4094 ? ? 468.440
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 8.300 8.600 100.000 ? ? ? 24.200 380
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 105 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON ALS BEAMLINE 12.3.1 1.03321 ALS 12.3.1
Software
Software Name Purpose Version
HKL-2000 data reduction .
PHENIX refinement (phenix.refine: 1.9_1692)
PDB_EXTRACT data extraction 3.15
HKL-2000 data scaling .
DENZO data reduction .
SCALEPACK data scaling .