X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 7.5 298 100 mM TRIS, 27% PEG4000, 100mM Na-Acetate
Unit Cell:
a: 64.794 Å b: 128.225 Å c: 163.626 Å α: 88.790° β: 94.360° γ: 96.150°
Symmetry:
Space Group: P 1
Crystal Properties:
Matthew's Coefficient: 2.15 Solvent Content: 42.84
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT THROUGHOUT 2.2200 32.5000 246026 12380 95.3900 0.2108 0.2434 41.7200
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.22 48.74 95.4 ? ? 9.0 2.4 ? 246066 ? ? 39.670
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.22 2.34 81.4 ? ? 1.8 1.8 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON SOLEIL BEAMLINE PROXIMA 1 0.97902 SOLEIL PROXIMA 1
Software
Software Name Purpose Version
XDS data reduction .
PDB_EXTRACT data extraction 3.15
XSCALE data scaling .
PHASER phasing .
BUSTER refinement 2.11.2
XSCALE data reduction .