X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 6.2 289 BrsuA.01104.a.B1.PS01850 at 25.1 mg/mL against JCSG+ screen condition D3, 0.2 M NaCl, 0.1 M NaK Phosphate pH 6.2, 50% PEG 200, crystal tracking ID 246776d3, unique puck ID thi5-2
Unit Cell:
a: 89.850 Å b: 121.910 Å c: 133.720 Å α: 111.49° β: 106.53° γ: 89.81°
Symmetry:
Space Group: P 1
Crystal Properties:
Matthew's Coefficient: 2.84 Solvent Content: 56.7
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION ? THROUGHOUT 2.45 50.00 169402 8955 96.46 0.23807 0.25215 61.904
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.45 50 96.3 0.070 ? 10.87 2.3 ? 178399 ? ? ?
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.45 2.50 95.8 ? ? 2.04 2.3 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 21-ID-F 0.97872 APS 21-ID-F
Software
Software Name Purpose Version
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