X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 5.5 293 0.1 M Bis-tris, 2% 2-methyl-2,4-pentanediol (MPD), and 1.1 M ammonium sulfate
Unit Cell:
a: 47.481 Å b: 9.437 Å c: 22.621 Å α: 90.000° β: 95.180° γ: 90.000°
Symmetry:
Space Group: C 1 2 1
Crystal Properties:
Matthew's Coefficient: 1.85 Solvent Content: 33.35
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT FREE R-VALUE 1.2000 23.6440 2884 119 86.0100 0.1955 0.2564 17.1338
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.200 50.000 86.900 0.071 ? 11.100 2.400 ? 2911 ? ? ?
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.200 1.240 49.200 ? ? ? 1.500 154
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 19-ID 0.97940 APS 19-ID
Software
Software Name Purpose Version
HKL-2000 data reduction .
HKL-2000 data scaling .
PDB_EXTRACT data extraction 3.14
SHELX phasing .
PHENIX refinement (phenix.refine: 1.9_1692)
DENZO data reduction .
SCALEPACK data scaling .