X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION ? 277 30% polyethylene glycol 550 monomethyl ether/polyethylene glycol 20000, 0.1M carboxylic acids mix (sodium formate, ammonium acetate, sodium citrate, sodium/potassium tartrate, sodium oxamate), 0.1M imidazole/MES pH 6.5
Unit Cell:
a: 33.392 Å b: 49.506 Å c: 65.406 Å α: 87.74° β: 84.77° γ: 79.41°
Symmetry:
Space Group: P 1
Crystal Properties:
Matthew's Coefficient: 1.89 Solvent Content: 34.79
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT THROUGHOUT 1.77 26.772 36633 1829 91.53 0.1670 0.2031 20.1
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.77 48.65 91.6 ? 0.063 8.6 2.5 ? 36665 ? ? 16.3
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.77 1.86 88.5 ? 0.390 2.3 2.4 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 24-ID-C 0.97950 APS 24-ID-C
Software
Software Name Purpose Version
PHENIX refinement (1.10_2155)
XDS data reduction .
XDS data scaling .
PHASER phasing .