X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 6.5 ? 50MM MES-KOH PH6.5, 80MM MGCL2, 200MM KCL, 0.495MM PUTRESCEINE, 4.4-5.4% (W/V) PEG20000
Unit Cell:
a: 320.520 Å b: 362.210 Å c: 412.110 Å α: 90.00° β: 109.61° γ: 90.00°
Symmetry:
Space Group: C 1 2 1
Crystal Properties:
Matthew's Coefficient: 4 Solvent Content: 71
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION SAD THROUGHOUT 3.93 25.0 332261 6635 85.1 0.2065 0.2431 148.4
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
3.93 100.00 93.0 0.15 ? 6.80 3.4 ? 364651 ? -3.0 ?
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 3.93 4.17 61.0 ? 2.05 3.4
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON SLS BEAMLINE X06SA ? SLS X06SA
Software
Software Name Purpose Version
SHARP model building .
PHASER model building .
DM model building .
CNS model building .
PHENIX model building .
CNS refinement 1.3
XDS data reduction .
XSCALE data scaling .
SHARP phasing .
PHASER phasing .
DM phasing .
CNS phasing .
PHENIX phasing .
Feedback Form
Name
Email
Institute
Feedback