X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION ? ? 10% W/V PEG 8000, 20% V/V ETHYLENE GLYCOL, 0.02 M EACH OF SODIUM FORMATE, AMMONIUM ACETATE, TRISODIUM CITRATE, SODIUM POTASSIUM TARTRATE, 0.1 M MOPS/HEPES-NA (7.5)
Unit Cell:
a: 52.294 Å b: 79.156 Å c: 65.945 Å α: 90.00° β: 96.24° γ: 90.00°
Symmetry:
Space Group: C 1 2 1
Crystal Properties:
Matthew's Coefficient: 2.5 Solvent Content: 48
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION SAD ? 1.700 65.554 29385 2827 99.7 0.1767 0.2111 22.76
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.70 23.50 99.8 0.05 ? 16.10 4.9 ? 29385 ? 2.0 15.99
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.70 1.73 99.1 ? 2.90 2.8
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
ROTATING ANODE RIGAKU MICROMAX-007 HF ? ? ?
Software
Software Name Purpose Version
PHENIX refinement (PHENIX.REFINE)
HKL-3000 data reduction .
HKL-3000 data scaling .
SHELX phasing .