4UOP

X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 5.4 ? 100MM NA CACODYLATE PH 5.4, 100MM MGCL2, 33% PEG2000
Unit Cell:
a: 53.198 Å b: 53.700 Å c: 85.037 Å α: 71.63° β: 76.78° γ: 65.12°
Symmetry:
Space Group: P 1
Crystal Properties:
Matthew's Coefficient: 2.08 Solvent Content: 40.86
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT THROUGHOUT 1.75 80.20 73165 3847 94.79 0.17971 0.20738 30.899
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.75 47.96 94.8 0.07 ? 10.70 3.8 ? 77013 ? 2.0 ?
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.75 1.84 92.6 ? 2.50 3.8
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON SOLEIL BEAMLINE PROXIMA 1 ? SOLEIL PROXIMA 1
Software
Software Name Purpose Version
REFMAC refinement 5.8.0071
XDS data reduction .
SCALA data scaling .
PHASER phasing .