X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION ? 293 0.2 M sodium thiocyanate and 2.2 M ammonium sulfate
Unit Cell:
a: 11.609 Å b: 18.107 Å c: 17.843 Å α: 90.000° β: 105.240° γ: 90.000°
Symmetry:
Space Group: P 1 21 1
Crystal Properties:
Matthew's Coefficient: 1.56 Solvent Content: 21.33
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION AB INITIO PHASING FREE R-VALUE 1.0010 12.4760 3281 146 83.2100 0.0886 0.1104 2.7193
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.000 50.000 83.200 0.074 ? 14.400 2.900 ? 3289 ? ? 2.560
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.000 1.040 59.600 ? ? ? 2.000 239
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 23-ID-B 0.77490 APS 23-ID-B
Software
Software Name Purpose Version
HKL-2000 data reduction .
PDB_EXTRACT data extraction 3.14
HKL-2000 data scaling .
PHENIX refinement (phenix.refine: 1.9_1692)
SHELX phasing .
DENZO data reduction .
SCALEPACK data scaling .