X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 8.5 289 11%-13% PEG4000, 100mM Tris-HCl, 200mM NaAc, 100mM Glycine, 50mM LiAc
Unit Cell:
a: 111.412 Å b: 118.143 Å c: 225.873 Å α: 92.230° β: 93.550° γ: 106.060°
Symmetry:
Space Group: P 1
Crystal Properties:
Matthew's Coefficient: 3.55 Solvent Content: 65.32
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT NONE 3.0030 43.7970 195232 9789 88.7700 0.1815 0.2185 57.0400
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
3.000 50.000 98.800 0.105 ? 8.300 3.100 ? 216153 ? ? 55.400
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 3.000 3.110 98.300 ? ? ? 3.000 21442
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON PHOTON FACTORY BEAMLINE BL-1A 1.1 Photon Factory BL-1A
Software
Software Name Purpose Version
HKL-2000 data processing .
HKL-2000 data scaling .
RESOLVE phasing .
Coot model building .
PDB_EXTRACT data extraction 3.14
PHASER phasing .
PHASER model building .
HKL data reduction .
HKL data scaling .
PHENIX refinement (phenix.refine: 1.8.4_1496)
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