X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 6.5 293 30% v/v Pentaerythritol Ethoxylate (15/4 EO/OH), 0.05M Ammonium Sulfate, 0.05M Bis-Tris, pH 6.5,
Unit Cell:
a: 44.944 Å b: 44.944 Å c: 117.883 Å α: 90.000° β: 90.000° γ: 90.000°
Symmetry:
Space Group: P 43 2 2
Crystal Properties:
Matthew's Coefficient: 2.68 Solvent Content: 54.12
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION SAD THROUGHOUT 1.9400 44.9400 9526 457 99.7900 0.2224 0.2533 65.1030
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.940 50.000 99.800 0.060 0.060 8.700 16.000 ? 9566 0 ? 36.3
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.940 1.970 100.000 ? ? ? 16.700 465
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 19-BM 0.97904 APS 19-BM
Software
Software Name Purpose Version
HKL-3000 data collection .
HKL-3000 data reduction .
HKL-3000 data scaling .
SCALEPACK data scaling .
HKL-3000 phasing .
SHELXDE phasing .
DM phasing .
RESOLVE phasing .
ARP model building .
Coot model building .
PDB_EXTRACT data extraction 3.14
REFMAC refinement 5.8.0049