X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 7.5 286 10mM DTT, 100mM Hepes, 0.1% (v/v) NP-40, 1.6M NaCitrate. Compound in 5%DMSO soaked in to apo crystals @ 250uM.
Unit Cell:
a: 117.559 Å b: 36.525 Å c: 51.251 Å α: 90.000° β: 100.820° γ: 90.000°
Symmetry:
Space Group: C 1 2 1
Crystal Properties:
Matthew's Coefficient: 1.98 Solvent Content: 37.80
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION FOURIER SYNTHESIS THROUGHOUT 1.7500 18.2600 21137 1079 95.1100 0.1878 0.2109 28.6500
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.750 20.000 96.300 0.063 0.063 32.200 3.750 ? 21138 ? ? 28.790
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.750 1.810 94.100 ? 0.501 2.710 3.8 2252
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 193.0 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
ROTATING ANODE RIGAKU FR-D 1.54 ? ?
Software
Software Name Purpose Version
SCALEPACK data scaling .
BUSTER-TNT refinement .
PDB_EXTRACT data extraction 3.14
BUSTER refinement 2.11.4