ISDA

X-RAY DIFFRACTION

Crystallization Details

Method	pH	Temprature	Details
X-RAY DIFFRACTION	8.0	277	Crystals were grown with the sitting-drop vapor diffusion technique by mixing 0.75 ul of the TlpA-ScoI complex (10 mg/ml in 10 mM Tris-HCl, pH 8) with 0.75 ul of precipitant solution (final concentration: 3% glycerol, 0.2 M NaSCN and 16.0% (w/v) PEG 3350) and equilibration over 100 ul of well solution (3% Glycerol, 0.2 M NaSCN, 28% PEG 3350).

Unit Cell:

a: 60.030 Å b: 173.220 Å c: 66.690 Å α: 90.000° β: 89.970° γ: 90.000°

Symmetry:

Space Group: P 1 21 1

Crystal Properties:

Matthew's Coefficient: 2.23 Solvent Content: 44.87

Refinement Statistics

Diffraction ID	Structure Solution Method	Cross Validation Method	Resolution Limit (High)	Resolution Limit (Low)	Number of Reflections (Observed)	Number of Reflections (R-free)	Percent Reflections (Observed)	R-Work	R-Free	Mean Isotropic
X-RAY DIFFRACTION	MOLECULAR REPLACEMENT	FREE R-VALUE	2.2000	49.3380	68109	1371	98.8900	0.1749	0.2068	43.4300

Data Collection

Overall

Resolution Limit (High)	Resolution Limit (Low)	Percent Possible (Observed)	R Merge I (Observed)	R Sym I (Observed)	Net I Over Average Sigma (I)	Redundancy	Number Reflections (All)	Number Reflections (Observed)	Observed Criterion Sigma (F)	Observed Criterion Sigma (I)	B (Isotropic) From Wilson Plot
2.200	50	98.900	0.147	?	10.550	7.5	?	68110	?	-3.000	40.4

Highest Resolution Shell

#	Resolution Limits (Low)	Resolution Limits (High)	Percent Possible (All)	Percent Possible (Observed)	R-Sym I (Observed)	Mean I Over Sigma (Observed)	Redundancy	Number Unique Reflections (All)
1	2.200	2.300	94.700	?	?	1.320	?	?

Diffraction

Diffraction experiment

Crystal ID	Scattering Type	Data Collection Temprature	Detector	Detector Type	Details	Collection Date	Monochromator	Protocol
1		100 K			?

Radiation Source

Source	Type	Wavelength List	Synchrotron Site	Beamline
SYNCHROTRON	SLS BEAMLINE X06DA	0.97941	SLS	X06DA

Software