X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION ? 293 14% w/v (+/-)-2-methyl-2,4-pentanediol, 4% v/v 1,3-Propanediol or 14% w/v (+/-)-2-methyl-2,4-pentanediol, 5% w/v polyethylene glycol 8,000
Unit Cell:
a: 22.279 Å b: 25.960 Å c: 37.887 Å α: 93.75° β: 106.73° γ: 99.92°
Symmetry:
Space Group: P -1
Crystal Properties:
Matthew's Coefficient: 1.79 Solvent Content: 31.38
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION ? FREE R-VALUE 1.9001 22.051 5913 591 94.58 0.2259 0.2784 ?
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.79 25.38 94 ? ? 7.8 3.94 ? 7049 ? ? 49.420
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.79 1.85 90.7 ? 0.409 2.1 3.88 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
ROTATING ANODE Cu FINE FOCUS 1.5418 ? ?
Software
Software Name Purpose Version
PHENIX refinement (phenix.refine: 1.8.2_1309)
PDB_EXTRACT data extraction 3.14