X-RAY DIFFRACTION
| Crystal ID | Scattering Type | Data Collection Temprature | Detector | Detector Type | Details | Collection Date | Monochromator | Protocol |
|---|---|---|---|---|---|---|---|---|
| 1 | 285 K |
| Source | Type | Wavelength List | Synchrotron Site | Beamline |
|---|---|---|---|---|
| ROTATING ANODE | ELLIOTT GX-3 | ? | ? | ? |
| Software Name | Purpose | Version |
|---|---|---|
| TNT | refinement | . |
| VENUS | data reduction | . |
| ODPROC | data scaling | . |
| PROLSQ | refinement | . |
