X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 7.5 293 1.6 M ammonium sulfate, 0.1 M NaCl, 0.1 M HEPES pH 7.5, VAPOR DIFFUSION, SITTING DROP, temperature 293K
Unit Cell:
a: 33.515 Å b: 68.939 Å c: 40.947 Å α: 90.00° β: 112.53° γ: 90.00°
Symmetry:
Space Group: P 1 21 1
Crystal Properties:
Matthew's Coefficient: 1.72 Solvent Content: 28.6
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION SAD ? 1.099 37.821 62763 3177 89.99 0.1251 0.1392 ?
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.099 37.821 90.1 0.048 ? 30 3.8 69740 62764 2 2 ?
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.09 1.12 45.5 ? ? ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 19-BM 0.9794 APS 19-BM
Software
Software Name Purpose Version
SBC-Collect data collection .
HKL-3000 phasing .
MLPHARE phasing .
DM model building .
ARP/wARP model building .
CCP4 model building .
PHENIX refinement (phenix.refine: dev_1834)
HKL-3000 data reduction .
HKL-3000 data scaling .
DM phasing .
CCP4 phasing .
Feedback Form
Name
Email
Institute
Feedback