X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 6.0 293 20% PEG 3350, 0.2M ammonium formate, pH 6.0, vapor diffusion, temperature 293K
Unit Cell:
a: 39.850 Å b: 85.230 Å c: 89.610 Å α: 90.000° β: 90.000° γ: 90.000°
Symmetry:
Space Group: P 21 21 21
Crystal Properties:
Matthew's Coefficient: 2.26 Solvent Content: 45.57
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT THROUGHOUT 1.8000 42.6200 26105 1287 89.8400 0.1817 0.2034 30.5400
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.800 50.000 99.800 0.148 ? 8.100 4.700 ? 29048 ? ? 24.820
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.800 1.830 97.500 ? ? ? 4.200 1384
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON ALS BEAMLINE 5.0.3 0.9765 ALS 5.0.3
Software
Software Name Purpose Version
DENZO data reduction .
SCALEPACK data scaling .
BUSTER-TNT refinement BUSTER 2.11.5
PDB_EXTRACT data extraction 3.15
HKL-2000 data reduction .
HKL-2000 data scaling .
BUSTER refinement .
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