X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 6.5 289 0.2M MaCl2, 0.1M Bis-Tris:HCl, 25% (w/v) PEG3350, pH 6.5, VAPOR DIFFUSION, SITTING DROP, temperature 289K
Unit Cell:
a: 98.525 Å b: 100.588 Å c: 150.602 Å α: 90.00° β: 90.00° γ: 90.00°
Symmetry:
Space Group: C 2 2 21
Crystal Properties:
Matthew's Coefficient: 2.20 Solvent Content: 44.14
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION SAD ? 1.040 18.730 323945 16176 91.40 0.1127 0.1306 ?
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.04 18.8 97.2 0.046 ? 31.1 5.7 344461 344461 0 -5 14.996
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.04 1.06 81.9 ? ? 1.98 3.6 14456
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 19-ID 0.97918 APS 19-ID
Software
Software Name Purpose Version
SBC-Collect data collection .
SHELXD phasing Builder/HKL3000
MLPHARE phasing Builder/HKL3000
DM model building Builder/HKL3000
DENZO data reduction Builder/HKL3000
SCALEPACK data scaling Builder/HKL3000
PHENIX refinement (phenix.refine: 1.9_1692)
HKL-3000 data reduction .
HKL-3000 data scaling .
DM phasing Builder/HKL3000
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