X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 6.8 298 1.75 M (NH4)2SO4, 0.1 M HEPES, 2% PEG 400, pH 6.8, VAPOR DIFFUSION, HANGING DROP, temperature 298K
Unit Cell:
a: 132.368 Å b: 132.368 Å c: 132.368 Å α: 90.000° β: 90.000° γ: 90.000°
Symmetry:
Space Group: P 4 3 2
Crystal Properties:
Matthew's Coefficient: 3.08 Solvent Content: 60.08
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MIR THROUGHOUT 2.7000 19.7300 11408 548 99.4900 0.2154 0.2837 34.629
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.699 19.732 99.700 ? 0.158 36.200 41.800 11408 11408 ? ? ?
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.700 2.850 99.600 ? 0.728 1.100 42.200 1617
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
ROTATING ANODE RIGAKU MICROMAX-007 HF 1.5418 ? ?
Software
Software Name Purpose Version
SCALA data scaling 3.3.20
REFMAC refinement 5.7
PDB_EXTRACT data extraction 3.15
StructureStudio data collection .
XDS data reduction .
SHARP phasing .