X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 8.5 291 0.3 M sodium acetate, 0.1 M sodium cacodylate, and 25% w/v PEG 2K MME, pH 8.5, VAPOR DIFFUSION, SITTING DROP, temperature 291K
Unit Cell:
a: 62.740 Å b: 132.970 Å c: 133.030 Å α: 62.40° β: 99.06° γ: 80.93°
Symmetry:
Space Group: P 1
Crystal Properties:
Matthew's Coefficient: 2.86 Solvent Content: 56.94
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT THROUGHOUT 2.61 50.00 94636 5003 90.20 0.19976 0.26071 65.240
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.61 113.76 90.2 0.11 0.11 4.7 3.53 122464 110464 0 0 ?
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.61 2.67 65.7 ? ? 1.2 2.5 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON ALS BEAMLINE 5.0.1 0.97 ALS 5.0.1
Software
Software Name Purpose Version
BOS data collection .
PHASER phasing .
REFMAC refinement 5.7.0029
MOSFLM data reduction .
SCALA data scaling .