ISDA: 4RPF

X-RAY DIFFRACTION

Crystallization Details

Method	pH	Temprature	Details
X-RAY DIFFRACTION	5.6	294	PROTEIN IN 10 MM BIS-TRIS, 500 MM SODIUM CHLORIDE, 10% GLYCEROL, 5 MM DTT, 10 MM D-GLUCOSE, RESERVOIR: 0.17 M AMMONIUM ACETATE, 0.085 M SODIUM CITRATE, PH 5.6, 25.5% W/V PEG4000, 15% W/V GLYCEROL, 0.5 M 2-Aminoethylphosphonate; CRYOPROTECTANT = RESERVOIR, VAPOR DIFFUSION, SITTING DROP, TEMPERATURE 294K

Unit Cell:

a: 162.861 Å b: 93.659 Å c: 107.617 Å α: 90.00° β: 90.14° γ: 90.00°

Symmetry:

Space Group: C 1 2 1

Crystal Properties:

Matthew's Coefficient: 4.13 Solvent Content: 70.23

Refinement Statistics

Diffraction ID	Structure Solution Method	Cross Validation Method	Resolution Limit (High)	Resolution Limit (Low)	Number of Reflections (Observed)	Number of Reflections (R-free)	Percent Reflections (Observed)	R-Work	R-Free	Mean Isotropic
X-RAY DIFFRACTION	SAD	THROUGHOUT	2.30	40.72	68460	2024	97.36	0.24189	0.29054	57.805

Data Collection

Overall

Resolution Limit (High)	Resolution Limit (Low)	Percent Possible (Observed)	R Merge I (Observed)	R Sym I (Observed)	Net I Over Average Sigma (I)	Redundancy	Number Reflections (All)	Number Reflections (Observed)	Observed Criterion Sigma (F)	Observed Criterion Sigma (I)	B (Isotropic) From Wilson Plot
2.300	50.000	98.6	0.08400	0.08400	18.2500	6.000	?	70518	?	-3.000	?

Highest Resolution Shell

#	Resolution Limits (Low)	Resolution Limits (High)	Percent Possible (All)	Percent Possible (Observed)	R-Sym I (Observed)	Mean I Over Sigma (Observed)	Redundancy	Number Unique Reflections (All)
1	2.30	2.34	97.9	?	?	1.500	6.00	?

Diffraction

Diffraction experiment

Crystal ID	Scattering Type	Data Collection Temprature	Detector	Detector Type	Details	Collection Date	Monochromator	Protocol
1		100 K

Radiation Source

Source	Type	Wavelength List	Synchrotron Site	Beamline
SYNCHROTRON	NSLS BEAMLINE X29A	?	NSLS	X29A

Software